Magnetic & Material Characterization Instruments
Hall Effect Measurement System
Vibrating Sample Magnetometer
Hard Magnetic Materials Testing Systems
Soft Magnetic Materials Testing Systems
Cemented Carbide Property Testing
Magneto-Optical Kerr Effect Measurement Systems
Magnetic Field Mapping Instruments
Magnetic Shielding
Functional Material Measurement
Cryogenic & Temperature Control Systems
Cryogenic Temperature Controllers
Cryogenic Temperature Monitors
Cryostats
Cryogenic Probe Station
Cryogenic Thermometer
Cryocooler
Cryogenic Accessories
Magnetic Field Measurement Equipment
Handheld & Bench-top Gaussmeters
3D Gauss meter
Fluxmeter
Fluxgate Magnetometers (Low-Field Detection)
Hall Probe
Magnetic Field Generation Systems
Helmholtz Coils
Electromagnet
Superconducting Magnet Systems
Cryogenic Hall Effect Sensors
Solenoids
Constant magnetic field
Rotating magnetic field
Electromagnet System
Helmholtz Coil System
Precision Magnet Power & Control Systems
Power Supplies for Electromagnets
Superconducting Magnet Power Supplies
Current Source
Power Amplifier
Lock-in Amplifier
Vacuum Processing & Thin Film Deposition
Vacuum Annealing Furnace
Vacuum Sintering Furnace
Vacuum Melt Spinning
PVD Coating Equipment
Vacuum Arc Remelting Furnace
Solar Cell Preparation
Film Growing Equipment
Crystal Material Preparation
Wafer-Level Kerr Effect Measurement Instrument

Wafer-Level Kerr Effect Measurement Instrument

This system uses polar MOKE to non - destructively analyze magnetic properties of wafer stacks before and after patterning with full - field measurement capability.

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