LNPS-80 Low Temperature Probe Station | Cryomagtech

LNPS-80 low-temperature probe station enables precise DC, RF and microwave testing from 80 K to 425 K with high stability and modular design.

1. Product Overview

The Cryomagtech LNPS-80 Low Temperature Probe Station provides a reliable platform for non-destructive electrical, optical, and microwave measurements on materials and semiconductor devices.

It supports device sizes up to 80 mm, making it ideal for research on nanoelectronic materials, quantum wires, quantum dots, and semiconductor structures.

The LNPS-80 offers precise temperature control from 80 K to 425 K, using liquid nitrogen cooling with a heat-shielded chamber that reduces blackbody radiation and minimizes LN2 consumption.

Its modular design allows users to configure probes, sample stages, and measurement cables for different experimental needs, supporting DC, RF, and microwave measurements.

2. Key Features

Liquid nitrogen cooling for fast and stable temperature control
Interchangeable sample stages for flexible configuration
Temperature range: 80 K – 425 K
Temperature stability: ≤ 50 mK
Probe position accuracy: 10 µm
Four precision probe arms, each with XYZ fine adjustment
Three DC coaxial probes + one 40 GHz microwave probe
Probe travel: XY 25 mm / Z > 50 mm
High-magnification optical microscope for accurate alignment and imaging
Beryllium / tungsten probes minimize thermal conduction to the sample

3. Technical Specifications

Parameter	Specification
Temperature range	80 K – 425 K
Temperature stability	≤ 50 mK
Maximum sample size	80 mm
Number of probe arms	4 (3 DC + 1 Microwave 40 GHz)
Probe tip diameter	10 µm
Probe arm travel (XY)	± 25 mm
Probe arm travel (Z)	> 50 mm
Probe arm material	304 Stainless Steel + G10 Composite
Cooling method	Liquid nitrogen with thermal radiation shield
Microscope	High-magnification optical microscope
Measurement modes	DC / RF / Microwave