Standard Cryogenic Probe Station
Precision cryogenic probe station for electrical and magnetic testing of semiconductors, spintronics, and micro-nano devices in low-temperature settings.
Wafer-Level In-Plane Magnetic Field Probe Station
Automated wafer-level probe station with in-plane magnetic field control, ±1% field uniformity, real-time feedback, and 0.02 mT resolution.
3D Magnetic Field Cryogenic Probe Station
Versatile cryogenic probe station enabling multi-axis magnetic field control and low-temperature testing. Ideal for semiconductors, MEMS, and superconducting materials.
2D Magnetic Field Cryogenic Probe Station
Dual-axis cryogenic probe station delivering vertical and in-plane magnetic fields with ±1% uniformity and 0.02 mT resolution. Ideal for semiconductor testing.
1D In-Plane Magnetic Field Probe Station
High-precision cryogenic probe station delivering stable 1D in-plane magnetic fields with ±1% uniformity and 0.02 mT resolution. Suitable for material testing.
Wafer-Level Vertical Magnetic Field Probe Station
High-precision wafer-level probe station with vertical magnetic field, ±1% field uniformity, and 0.02 mT resolution. Designed for cryogenic material testing.
1D Vertical Magnetic Field Probe Station
Cryogenic probe station delivering a uniform 1D vertical magnetic field (±1%@⌀2 mm) with high-resolution field monitoring (0.02 mT).
Universal Magnetic Field Probe Station
High-precision probe station for testing magnetic and electrical properties of semiconductors and spintronic devices under in-plane magnetic fields up to 330 mT.