Ferroelectric Characterization and Hysteresis Test System
This system performs ferroelectric hysteresis loop, fatigue, imprint, leakage, and C - V tests, as well as dielectric and capacitance characterization for material evaluation.
Laser Doppler Vibrometer for Material Vibration Analysis
This non - contact laser vibrometer delivers high - resolution vibration data for material testing, ideal for MEMS, strain analysis, and dynamic response measurements.
Precision Impedance Analyzer for Functional Materials
This analyzer measures complex impedance across frequencies for materials and components. Suitable for electronic devices, biological samples, and dielectric testing.
Dielectric Charging & Discharging Measurement System
This system evaluates the charge and discharge behavior of dielectric materials under high voltage conditions, ideal for energy storage and capacitor research.
High-Voltage Insulation Resistance Tester
This tester evaluates insulation resistance of materials using a parallel plate setup with enhanced anti - interference capability for stable, accurate high - voltage testing.
Multi-Channel LCR Measurement System
This system supports multi-channel LCR testing for precise measurement of capacitance, inductance, and resistance in components, materials, and sensor R&D.
Dielectric Property Measurement System
This system measures permittivity, capacitance, and dielectric loss of insulating materials across wide frequency and temperature ranges, with optional breakdown and TSDC tests.
Piezoelectric Coefficient Analyzer
This analyzer measures the d33 piezoelectric coefficient of PZT and other materials with high sensitivity, using stable excitation and FPGA - based digital control for precise signal capture.
Electrical Property Measurement Platform
This platform evaluates electrical properties such as ferroelectricity, piezoelectricity, dielectricity, and resistivity under high and low temperature conditions.
Atomic Force Microscope for Nanostructure Imaging
This AFM system captures 3D nanostructure images of conductive, semiconductive, and insulating materials with 20 pm resolution and automated scanning control.