CVM200 Variable Temperature Hall Effect Tester | Cryomagtech
CVM200 Variable Temperature Hall Effect Tester | Cryomagtech

Compact Hall effect tester for studying carrier transitions, magnetoresistance, and conductivity under variable temperature.

Fast Hall Measurement Instrument | Cryomagtech ET99 Series
Fast Hall Measurement Instrument | Cryomagtech ET99 Series

Cryomagtech ET99 Fast Hall system provides one-click, high-speed Hall effect and resistivity measurement with compact design and optional low-temperature module.

Hall Effect and Electrical Transport Measurement System (ET-9000 Series)
Hall Effect and Electrical Transport Measurement System (ET-9000 Series)

Fully automated Hall effect and electrical transport measurement system for resistivity, mobility, and magnetoresistance testing.

CMT-70 Hall Effect Measurement System
CMT-70 Hall Effect Measurement System

Precision system for measuring carrier mobility, resistivity, and Hall coefficient in semiconductor research and material analysis.

CMT-100 High-Precision Hall Effect Measurement System
CMT-100 High-Precision Hall Effect Measurement System

CMT-100 offers accurate Hall effect measurement with advanced components for analyzing semiconductor materials.

CMT-30 Permanent Magnet Hall Effect Measurement Meter
CMT-30 Permanent Magnet Hall Effect Measurement Meter

CMT - 30 provides accurate Hall effect measurements using a permanent magnet setup, ideal for basic magnetic field testing and sensor evaluation.

CMT-50 Standard Hall Effect Measurement System
CMT-50 Standard Hall Effect Measurement System

CMT - 50 enables accurate Hall effect and resistivity analysis for semiconductor research, offering stable performance and reliable measurement results.

CMT-60 Compact Hall Effect Measurement Instrument
CMT-60 Compact Hall Effect Measurement Instrument

CMT-60 provides precise Hall effect and carrier mobility testing in a compact form, ideal for benchtop use in research and development labs.

CMT-3000 Hall Effect Characterization Device
CMT-3000 Hall Effect Characterization Device

CMT - 3000 is an automated system integrating Hall effect, magnetoresistance, and I - V curve testing for advanced semiconductor material characterization.

CMT-1000T Dual-Temperature Hall Effect Test System
CMT-1000T Dual-Temperature Hall Effect Test System

CMT-1000T enables Hall effect testing across high and low temperatures, integrating magnet, Gauss meter, Dewar, and precise temperature control.