CMT202 temperature controller offers precise 1.4–450 K control with 50 W output, PID stability, RS-232 communication, and excellent cost performance.
LNPS-80 low-temperature probe station enables precise DC, RF and microwave testing from 80 K to 425 K with high stability and modular design.
CMT-64 silicon diode thermometer delivers accurate cryogenic temperature readings with high repeatability and excellent V-T curve consistency.
Accurate platinum resistance thermometer for 20K–500K cryogenic temperature monitoring. Fast response, compact size, and magnetic field tolerance.
Precision cryogenic probe station for electrical and magnetic testing of semiconductors, spintronics, and micro-nano devices in low-temperature settings.
Automated wafer-level probe station with in-plane magnetic field control, ±1% field uniformity, real-time feedback, and 0.02 mT resolution.
Versatile cryogenic probe station enabling multi-axis magnetic field control and low-temperature testing. Ideal for semiconductors, MEMS, and superconducting materials.
Dual-axis cryogenic probe station delivering vertical and in-plane magnetic fields with ±1% uniformity and 0.02 mT resolution. Ideal for semiconductor testing.
High-precision cryogenic probe station delivering stable 1D in-plane magnetic fields with ±1% uniformity and 0.02 mT resolution. Suitable for material testing.
High-precision wafer-level probe station with vertical magnetic field, ±1% field uniformity, and 0.02 mT resolution. Designed for cryogenic material testing.