CMT-100 High-Precision Hall Effect Measurement System
CMT-100 offers accurate Hall effect measurement with advanced components for analyzing semiconductor materials.
CONTACT USProduct Introduction
The CMT-100 High-Precision Hall Effect Measurement System is designed to accurately measure key electrical parameters of semiconductor materials, including carrier concentration, mobility, resistivity, and the Hall coefficient. These parameters are critical for evaluating the electrical behavior of semiconductor devices and materials, making the Hall effect measurement system an essential tool for advanced semiconductor research, device characterization, and materials science studies.
This system provides precise and reliable data to support the development, quality control, and performance analysis of various semiconductor applications.
Integrated CMT-320 System SourceMeter
The CMT-320 System SourceMeter, specially developed for the CMT-100 Hall Effect Measurement System, integrates a high-stability constant current source with a low-noise microvoltmeter and a multi-channel switching relay into a compact unit. This integrated design significantly simplifies experimental wiring and operation, ensuring stable and accurate measurement performance.
The CMT-320 SourceMeter can also be used independently as both a constant current source and a microvoltmeter, providing flexibility for a wide range of testing needs.
Key Features
- Accurate measurement of carrier concentration, mobility, resistivity, and Hall coefficient
- Suitable for semiconductor devices, thin films, and bulk material analysis
- Integrated constant current source and microvoltmeter for stable performance
- Flexible system configuration with multi-channel switching capability
- Automated measurement process with user-friendly software interface
- Ideal for research laboratories, quality control, and semiconductor device development
Typical Applications
- Semiconductor material characterization
- Electronic device performance analysis
- Thin-film Hall measurements
- Magnetotransport research and testing
- Educational demonstrations and academic research projects
Parameters of CMT-100 High-Precision Hall Effect Measurement System:
| Physical parameters | Carrier concentration | 10³cm⁻³ - 10²³cm⁻³ |
| Mobility | 0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec | |
| Resistivity range | 10⁻⁷ Ohm*cm - 10¹² Ohm*cm | |
| Hall voltage | 1 uV - 3V | |
| Hall coefficient | 10⁻⁵ - 10²⁷cm³/ C | |
| Testable material type | Semiconductor material | SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc. |
| low resistance material | Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc. | |
| high resistance material | Semi-insulating GaAs, GaN, CdTe, etc. | |
| Material Conductive Particles | Type P and Type N testing of materials | |
| Magnetic field environment | Magnet Type | Variable electromagnet |
| Magnitude of magnetic field | 1900mT (The pole pitch is 10mm) | |
| 1300mT (The pole pitch is 20mm) | ||
| 900mT (The pole pitch is 30mm) | ||
| 800mT (The pole pitch is 40mm) | ||
| 600mT (The pole pitch is 50mm) | ||
| Uniform area: 1% | Minimum resolution: 0.1Gs | |
| Optional magnetic environment | The electromagnet of relevant magnetic size can be customized according to the needs of customers | |
| Electrical parameters | Current source | 50.00nA- 50.00mA |
| Current source resolution | 0.0001uA | |
| Measuring voltage | 0 ~ ±3V | |
| Voltage measurement resolution | 0.0001 mV | |
| Other Accessories | Shading | Extern ally installed light-shielding parts make the test material more stable |
| Sample size | normal 10mm * 10mm | |
| Maximum 16mm * 16mm | ||
| Box cabinet | 600*600*1000mm | |
| Test piece | Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set | |
| (Si, Ge, GaAs, lnSb) | ||
| Making ohmic contacts | Electric soldering iron, indium chip, solder, enameled wire, etc. | |
| One-button automatic measurement can be performed without the need for human operation after the test is started | ||
| The software can perform I-V curve and BV curve | ||
| Set in software for automatic temperature measurement | ||
| The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing. | ||
| Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set | ||
Testable samples of the hall effect measurement:
