
CMT - 30 provides accurate Hall effect measurements using a permanent magnet setup, ideal for basic magnetic field testing and sensor evaluation.
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The CMT-30 Permanent Magnet Hall Effect Measurement Meter is a precision instrument designed for analyzing the electrical properties of semiconductor materials. This system enables accurate measurement of carrier concentration, mobility, resistivity, and the Hall coefficient, offering critical insights into material performance in both research and teaching applications.
Cryomagtech's Hall measurement systems are developed with technical guidance from top scientific institutions specializing in solid-state physics and semiconductor analysis. Our team is dedicated to offering reliable support and customization based on customer needs.
We offer customizable configurations tailored to your application scenarios, including different magnetic field strengths, sample holders, and temperature environments. Contact us for a tailored solution.
| Physical parameters | Carrier concentration | 10³cm⁻³ - 10²³cm⁻³ |
| Mobility | 0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec | |
| Resistivity range | 10-5 Ohm*cm - 107 Ohm*cm | |
| Hall voltage | 1 uV - 3V | |
| Hall coefficient | 10⁻⁵ - 10²⁷cm³/ C | |
| Testable material type | Semiconductor material | SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc. |
| low resistance material | Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc. | |
| high resistance material | Semi-insulating GaAs, GaN, CdTe, etc. | |
| Material Conductive Particles | Type P and Type N testing of materials | |
| Magnetic field environment | Magnet Type | Nuclear magnetic resonance NMR series permanent magnets |
| Magnitude of magnetic field | 500mT (Pole head spacing: 18mm) | |
| Optional magnetic environment | The electromagnet of relevant magnetic size can be customized according to the needs of customers | |
| Electrical parameters | Current source | 50.00nA- 50.00mA |
| Current source resolution | 0.0001uA | |
| Measuring voltage | 0 ~ ±3V | |
| Voltage measurement resolution | 0.0001 mV | |
| Other Accessories | Shading | Extern ally installed light-shielding parts make the test material more stable |
| Sample size | Maximum 30mm * 30mm | |
| Box cabinet | 600*600*1000mm | |
| Test piece | Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set | |
| (Si, Ge, GaAs, lnSb) | ||
| Making ohmic contacts | Electric soldering iron, indium chip, solder, enameled wire, etc. | |
| One-button automatic measurement can be performed without the need for human operation after the test is started | ||
| The software can perform I-V curve and BV curve | ||
| Set in software for automatic temperature measurement | ||
| The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing. | ||
| Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set | ||


The CMT-30 system integrates a pair of high-stability permanent magnets that form a stable magnetic field environment for Hall measurements.

CMT-320 is an integrated current source and switching controller designed specifically for Hall effect testing. It simplifies wiring and minimizes manual operation.

The sample stage integrates with intelligent software to achieve seamless data acquisition and analysis.
To facilitate smooth setup and operation, the system includes the following auxiliary tools and components: