CMT-50 Standard Hall Effect Measurement System
CMT - 50 enables accurate Hall effect and resistivity analysis for semiconductor research, offering stable performance and reliable measurement results.
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The CMT-50 Standard Hall Effect Measurement System from Cryomagtech is a high-precision instrument designed for evaluating the electrical transport properties of semiconductor materials. It accurately measures critical parameters such as carrier concentration, mobility, resistivity, and Hall coefficient—essential for material research and quality control.
System Components
The CMT-50 system includes:
- Electromagnet – Generates stable magnetic fields for Hall effect experiments.
- Electromagnet Power Supply – Ensures precise magnetic field control.
- High-Precision Constant Current Source – Provides stable current for accurate measurement.
- High-Precision Voltmeter – Captures voltage signals with minimal noise interference.
- Hall Effect Sample Holder – Supports multiple sample formats for flexible testing.
- Standard Sample – Pre-calibrated for reference measurements.
- System Software – Enables automated control, data acquisition, and analysis.
Measurement Capabilities
The CMT-50 allows researchers to:
- Determine carrier concentration in semiconductor materials.
- Measure carrier mobility for performance evaluation.
- Analyze resistivity to assess electrical conduction.
- Calculate the Hall coefficient for material characterization.
- Perform temperature-dependent and magnetic field-dependent measurements (optional modules available).
CMT-320 Hall Effect Meter
The CMT-320 Hall Effect Meter, specifically designed for seamless integration with the CMT-50 system, combines a high-precision constant current source with a 6½-digit microvoltmeter and a Hall-effect switching relay in a single compact unit.
This integrated design minimizes wiring complexity and simplifies experimental operations, enabling faster setup and improved measurement stability.
In addition to its role within the Hall Effect Measurement System, the CMT-320 can operate independently as:
- A constant current source for general laboratory applications.
- A microvoltmeter for ultra-low voltage measurements.
Its dual-function capability makes the CMT-320 a versatile tool for both dedicated Hall effect analysis and broader electrical testing needs.
Parameters of Hall effect measurement system:
| Physical parameters | Carrier concentration | 10³cm⁻³ - 10²³cm⁻³ |
| Mobility | 0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec | |
| Resistivity range | 10⁻⁷ Ohm*cm - 10¹² Ohm*cm | |
| Hall voltage | 1 uV - 3V | |
| Hall coefficient | 10⁻⁵ - 10²⁷cm³/ C | |
| Testable material type | Semiconductor material | SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials etc. |
| low resistance material | Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc. | |
| high resistance material | Semi-insulating GaAs, GaN, CdTe, etc. | |
| Material Conductive Particles | Type P and Type N testing of materials | |
| Magnetic field environment | Magnet Type | Variable electromagnet |
| Magnitude of magnetic field | 1070mT (The pole pitch is 10mm) | |
| 687mT (The pole pitch is 20mm) | ||
| 500mT (The pole pitch is 30mm) | ||
| 378mT (The pole pitch is 40mm) | ||
| 293mT (The pole pitch is 50mm) | ||
| Uniform area | 1% | |
| Optional magnetic environment | The electromagnet of relevant magnetic size can be customized according to the needs of customers | |
| Electrical parameters | Current source | 50.00nA- 50.00mA |
| Current source resolution | 0.0001uA | |
| Measuring voltage | 0 ~ ±3V | |
| Voltage measurement resolution | 0.0001 mV | |
| Other Accessories | Shading | Externally installed light-shielding parts make the test material more stable |
| Sample size | Maximum 30mm * 30mm | |
| Box cabinet | 600*600*1000mm | |
| Test piece | Hall effect of the Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set | |
| (GaAs, ITO) | ||
| Making ohmic contacts | Electric soldering iron, indium chip, solder, enameled wire, etc. | |
| One-button automatic measurement can be performed without the need for human operation after the test is started | ||
| The software can perform I-V curve and BV curve | ||
| Set in software for automatic temperature measurement | ||
| The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing. | ||
| Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set | ||
Testable samples of hall measurement system:
Sample Stage of CMT-50 Standard Hall Effect Measurement System