
CMT-60 provides precise Hall effect and carrier mobility testing in a compact form, ideal for benchtop use in research and development labs.
CONTACT USThe CMT-60 Compact Hall Effect Measurement Instrument is designed for precise characterization of semiconductor materials. It provides accurate measurements of key electrical parameters such as carrier concentration, mobility, resistivity, and Hall coefficient. These parameters are essential for evaluating and controlling the electrical properties of semiconductors, making the CMT-60 a powerful tool for both research and quality control in semiconductor device development.
| Physical parameters | Carrier concentration | 10³cm⁻³ - 10²³cm⁻³ |
| Mobility | 0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec | |
| Resistivity range | 10⁻⁷ Ohm*cm - 10¹² Ohm*cm | |
| Hall voltage | 1 uV - 3V | |
| Hall coefficient | 10⁻⁵ - 10²⁷cm³/ C | |
| Testable material type | Semiconductor material | SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc. |
| Low resistance material | Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc. | |
| High resistance material | Semi-insulating GaAs, GaN, CdTe, etc. | |
| Material Conductive Particles | Type P and Type N testing of materials | |
| Magnetic field environment | Magnet Type | Variable electromagnet |
| Magnitude of magnetic field | The diameter of the polar face is 50mm1.22T@10mm Gap 0.74T@20mm Gap 0.51T@30mm Gap | |
| Uniform area | 1% | |
| Optional magnetic environment | The electromagnet of relevant magnetic size can be customized according to the needs of customers | |
| Electrical parameters | Current source | 50.00nA- 50.00mA |
| Current source resolution | 0.0001uA | |
| Measuring voltage | 0 ~ ±3V | |
| Voltage measurement resolution | 0.0001 mV | |
| Temperature environment | 80K-500K(Temperature control precision:0.1K) | |
| Other Accessories | Shading | Externally installed light-shielding parts make the test material more stable |
| Sample size | Maximum 15mm * 15mm | |
| Box cabinet | 600*600*1000mm | |
| Test piece | Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set(GaAs, ITO) | |
| Making ohmic contacts | Electric soldering iron, indium chip, solder, enameled wire, etc. | |
| One-button automatic measurement can be performed without the need for human operation after the test is started | ||
| The software can perform I-V curve and BV curve | ||
| Set in software for automatic temperature measurement | ||
| The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing. | ||
| Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set | ||

The CMT-60 system incorporates the CMT-320 Hall Effect Meter, developed specifically for this instrument platform.
The system software provides automated data acquisition and analysis, supporting parameters such as:
The software automatically calculates experimental results, ensuring accuracy and improving workflow efficiency.
For product details, customization requests, or quotations, please contact:
Cryomagtech
🌐 Website: www.cryomagtech.com
📧 Email: edaystore@outlook.com