CMT-70 Hall Effect Measurement System
Precision system for measuring carrier mobility, resistivity, and Hall coefficient in semiconductor research and material analysis.
CONTACT USProduct Introduction
The CMT-70 Hall Effect Measurement System is a high-precision testing platform designed for accurate measurement of semiconductor material properties. The system integrates key components including:
- Electromagnet and electromagnet power supply
- High-stability constant current source
- Precision voltmeter
- High-speed matrix switch card
- Hall effect sample holder and reference sample
- Dedicated control and analysis software
This system adopts the latest KEITHLEY precision source meter, paired with a low-latency, high-bandwidth matrix card. The optimized configuration significantly enhances both the current sourcing range and the accuracy of Hall voltage measurements. With a wide current supply range and flexible voltage testing capability, the CMT-70 meets the requirements for most semiconductor device evaluations.
The automated software calculates and outputs critical electrical parameters with high efficiency, including:
- Bulk Carrier Concentration
- Sheet Carrier Concentration
- Mobility
- Resistivity
- Hall Coefficient
- Magnetoresistance
Key Features
- High Measurement Accuracy: KEITHLEY source meter combined with high-speed matrix switching ensures stable current supply and precise voltage detection.
- Wide Testing Range: Covers a broad spectrum of semiconductor materials and device types, from thin films to bulk samples.
- Automated Data Analysis: Software-driven result calculation minimizes manual operations and reduces potential errors.
- Flexible Configuration: Supports multiple sensor types and experimental setups for Hall effect and resistivity measurements.
- User-Friendly Software Interface: Easy-to-operate control panel with clear parameter settings, real-time monitoring, and data export options.
Typical Applications
- Semiconductor material research and development
- Thin-film characterization
- Electronic device performance testing
- Magnetoresistance and mobility studies
Note: The CMT-70 Hall Effect Measurement System is suitable for university laboratories, research institutions, and industrial R&D environments. Custom configurations and system upgrades are available upon request.
Parameters of CMT-70 Hall Effect Measurement System:
| Physical parameters | Carrier concentration | 10³cm⁻³ - 10²³cm⁻³ |
| Mobility | 0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec | |
| Resistivity range | 10⁻⁷ Ohm*cm - 10¹² Ohm*cm | |
| Hall voltage | 1 uV - 3V | |
| Hall coefficient | 10⁻⁵ - 10²⁷cm³/ C | |
| Testable material type | Semiconductor material | SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc. |
| low resistance material | Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc. | |
| high resistance material | Semi-insulating GaAs, GaN, CdTe, etc. | |
| Material Conductive Particles | Type P and Type N testing of materials | |
| Magnetic field environment | Magnet Type | Variable electromagnet |
| Magnitude of magnetic field | 1070mT (The pole pitch is 10mm) | |
| 687mT (The pole pitch is 20mm) | ||
| 500mT (The pole pitch is 30mm) | ||
| 378mT (The pole pitch is 40mm) | ||
| 293mT (The pole pitch is 50mm) | ||
| Uniform area | 1% | |
| Optional magnetic environment | The electromagnet of relevant magnetic size can be customized according to the needs of customers | |
| Electrical parameters | Current source | ±0.1nA- ±1000mA |
| Current source resolution | 0.001uA | |
| Measuring voltage | ±10nV ~ ±200V | |
| Voltage measurement resolution | 0.0001 mV | |
| Other Accessories | Shading | Extern ally installed light-shielding parts to make the test material more stable |
| Sample size | Maximum 30mm * 30mm | |
| Box cabinet | 600*600*1000mm | |
| Test piece | Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set | |
| (Si, Ge, GaAs, lnSb) | ||
| Making ohmic contacts | Electric soldering iron, indium chip, solder, enameled wire, etc. | |
| One-button automatic measurement can be performed without the need for human operation after the test is started | ||
| The software can perform I-V curve and BV curve | ||
| Set in software for automatic temperature measurement | ||
| The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing. | ||
| Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set | ||
Testable samples of the HMS system:
